System and Bayesian reliability essays in honor of Professor Richard E. Barlow on his 70th birthday /

Saved in:
Bibliographic Details
Corporate Author: ebrary, Inc
Other Authors: Hayakawa, Yu, Irony, Telba, Xie, M. (Min), Barlow, Richard E.
Format: Electronic eBook
Language:English
Published: River Edge, NJ : World Scientific, c2001.
Series:Series on quality, reliability & engineering statistics ; v. 5.
Subjects:
Online Access:An electronic book accessible through the World Wide Web; click to view
Tags: Add Tag
No Tags, Be the first to tag this record!