Advanced production testing of RF, SoC, and SiP devices

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Bibliographic Details
Main Author: Kelly, Joe
Corporate Author: ebrary, Inc
Other Authors: Engelhardt, M. (Michael)
Format: Electronic eBook
Language:English
Published: Boston : Artech House, 2007.
Series:Artech House microwave library.
Subjects:
Online Access:An electronic book accessible through the World Wide Web; click to view
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020 |z 158053709X 
020 |z 9781580537094 
020 |z 9781580537100 
035 |a (CaPaEBR)ebr10221935 
035 |a (OCoLC)567967770 
040 |a CaPaEBR  |c CaPaEBR 
050 1 4 |a TK7895.E42  |b K49 2007eb 
100 1 |a Kelly, Joe. 
245 1 0 |a Advanced production testing of RF, SoC, and SiP devices  |h [electronic resource] /  |c Joe Kelly, Michael Engelhardt. 
260 |a Boston :  |b Artech House,  |c 2007. 
300 |a xx, 301 p. :  |b ill. 
490 1 |a Artech House microwave library 
504 |a Includes bibliographical references and index. 
533 |a Electronic reproduction.  |b Palo Alto, Calif. :  |c ebrary,  |d 2009.  |n Available via World Wide Web.  |n Access may be limited to ebrary affiliated libraries. 
650 0 |a Systems on a chip  |x Testing. 
650 0 |a Embedded computer systems. 
655 7 |a Electronic books.  |2 local 
700 1 |a Engelhardt, M.  |q (Michael) 
710 2 |a ebrary, Inc. 
830 0 |a Artech House microwave library. 
856 4 0 |u http://site.ebrary.com/lib/daystar/Doc?id=10221935  |z An electronic book accessible through the World Wide Web; click to view 
908 |a 170314 
942 0 0 |c EB 
999 |c 88059  |d 88059