Cita APA (7a ed.)
Kelly, J., & Engelhardt, M. (2007). Advanced production testing of RF, SoC, and SiP devices. Artech House.
Cita Chicago Style (17a ed.)
Kelly, Joe, y M. Engelhardt. Advanced Production Testing of RF, SoC, and SiP Devices. Boston: Artech House, 2007.
Cita MLA (9a ed.)
Kelly, Joe, y M. Engelhardt. Advanced Production Testing of RF, SoC, and SiP Devices. Artech House, 2007.
Precaución: Estas citas no son 100% exactas.