Kelly, J., & Engelhardt, M. (2007). Advanced production testing of RF, SoC, and SiP devices. Artech House.
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Chicago Style (17th ed.) Citation
Kelly, Joe, and M. Engelhardt. Advanced Production Testing of RF, SoC, and SiP Devices. Boston: Artech House, 2007.
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MLA引文
Kelly, Joe, and M. Engelhardt. Advanced Production Testing of RF, SoC, and SiP Devices. Artech House, 2007.
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警告：這些引文格式不一定是100％准確.