Boundary-scan interconnect diagnosis
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| Κύριος συγγραφέας: | |
|---|---|
| Συγγραφή απο Οργανισμό/Αρχή: | |
| Άλλοι συγγραφείς: | |
| Μορφή: | Ηλεκτρονική πηγή Ηλ. βιβλίο |
| Γλώσσα: | Αγγλικά |
| Έκδοση: |
Boston :
Kluwer Academic Publishers,
c2001.
|
| Σειρά: | Frontiers in electronic testing ;
18. |
| Θέματα: | |
| Διαθέσιμο Online: | An electronic book accessible through the World Wide Web; click to view |
| Ετικέτες: |
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Παρόμοια τεκμήρια: Boundary-scan interconnect diagnosis
- Failure analysis a practical guide for manufacturers of electronic components and systems /
- Parts selection and management
- Guide to state-of-the-art electron devices
- Materials for high-density electronic packaging and interconnection report of the Committee on Materials for High-Density Electronic Packaging, National Materials Advisory Board, Commission on Engineering and Technical Systems, National Research Council.
- Hertzian tales electronic products, aesthetic experience, and critical design /
- Reliability technology principles and practice of failure prevention in electronic systems /