High performance memory testing design principles, fault modeling, and self-test /
Gorde:
| Egile nagusia: | |
|---|---|
| Erakunde egilea: | |
| Formatua: | Baliabide elektronikoa eBook |
| Hizkuntza: | ingelesa |
| Argitaratua: |
Boston :
Kluwer Academic,
c2003.
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| Saila: | Frontiers in electronic testing.
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| Gaiak: | |
| Sarrera elektronikoa: | An electronic book accessible through the World Wide Web; click to view |
| Etiketak: |
Etiketarik gabe, Izan zaitez lehena erregistro honi etiketa jartzen!
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Antzeko izenburuak: High performance memory testing
- Non-volatile memories /
- Vertical 3D memory technologies /
- System-on-chip test architectures nanometer design for testability /
- High density data storage principle, technology, and materials /
- Terrestrial neutron-induced soft errors in advanced memory devices
- Data Storage faster access to smaller bits.