Design for at-speed test, diagnosis, and measurement
Gorde:
| Erakunde egilea: | |
|---|---|
| Beste egile batzuk: | |
| Formatua: | Baliabide elektronikoa eBook |
| Hizkuntza: | ingelesa |
| Argitaratua: |
Boston :
Kluwer Academic,
c2000.
|
| Saila: | Frontiers in electronic testing.
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| Gaiak: | |
| Sarrera elektronikoa: | An electronic book accessible through the World Wide Web; click to view |
| Etiketak: |
Etiketarik gabe, Izan zaitez lehena erregistro honi etiketa jartzen!
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Antzeko izenburuak: Design for at-speed test, diagnosis, and measurement
- Design for at-speed test, diagnosis, and measurement
- Wafer-level testing and test during burn-in for integrated circuits
- Wafer-level testing and test during burn-in for integrated circuits
- An engineer's guide to automated testing of high-speed interfaces
- An engineer's guide to automated testing of high-speed interfaces
- A designer's guide to built-in self-test