Electron microscopy and analysis

Electron microscopy and analysis

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Bibliographic Details
Main Author: Goodhew, Peter J.
Corporate Author: ebrary, Inc
Other Authors: Beanland, R., Humphreys, F. J.
Format: Electronic eBook
Language:English
Published: London : Taylor & Francis, 2001.
Edition:3rd ed.
Subjects:
Electron microscopy.
Electronic books.
Online Access:An electronic book accessible through the World Wide Web; click to view
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LEADER 00000nam a2200000 a 4500
001 0000066163
005 20171002053241.0
006 m u
007 cr cn|||||||||
008 010730s2001 enka sb 001 0 eng
010 |z  00037716 
015 |a GBA1-43398 
016 7 |a 0748409688  |2 Uk 
020 |z 0748409688(pbk.) 
035 |a (CaPaEBR)ebr10017829 
035 |a (OCoLC)70724582 
040 |a CaPaEBR  |c CaPaEBR 
050 1 4 |a QH212.E4  |b G62 2001eb 
082 0 4 |a 502.825  |2 21 
100 1 |a Goodhew, Peter J. 
245 1 0 |a Electron microscopy and analysis  |h [electronic resource] /  |c Peter J. Goodhew, John Humphreys, Richard Beanland. 
250 |a 3rd ed. 
260 |a London :  |b Taylor & Francis,  |c 2001. 
300 |a xi, 251 p. :  |b ill. 
500 |a Previous ed.: 1988. 
504 |a Includes bibliographical references and index. 
533 |a Electronic reproduction.  |b Palo Alto, Calif. :  |c ebrary,  |d 2013.  |n Available via World Wide Web.  |n Access may be limited to ebrary affiliated libraries. 
650 0 |a Electron microscopy. 
655 7 |a Electronic books.  |2 local 
700 1 |a Beanland, R. 
700 1 |a Humphreys, F. J. 
710 2 |a ebrary, Inc. 
856 4 0 |u http://site.ebrary.com/lib/daystar/Doc?id=10017829  |z An electronic book accessible through the World Wide Web; click to view 
908 |a 170314 
942 0 0 |c EB 
999 |c 55321  |d 55321 

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