Goodhew, P. J., Beanland, R., & Humphreys, F. J. (2001). Electron microscopy and analysis (3rd ed.). Taylor & Francis.
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Chicago-čujuhus (17. p.)
Goodhew, Peter J., R. Beanland, juo F. J. Humphreys. Electron Microscopy and Analysis. 3rd ed. London: Taylor & Francis, 2001.
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MLA-čujuhus (9. p.)
Goodhew, Peter J., et al. Electron Microscopy and Analysis. 3rd ed. Taylor & Francis, 2001.
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