Imaxe de Portada

Código QR

Applied Rasch Measurement: A Book of Exemplars Papers in Honour of John P. Keeves /

Gardado en:

Detalles Bibliográficos
Autor Principal:	Maclean, Rupert
Autor Corporativo:	SpringerLink (Online service)
Outros autores:	Watanabe, Ryo, Baker, Robyn, Boediono, Cheng, Yin Cheong, Duncan, Wendy, Keeves, John, Mansheng, Zhou, Power, Colin, Rajput, J. S., Thaman, Konai Helu, Alagumalai, Sivakumar, Curtis, David D., Hungi, Njora
Formato:	Electrónico eBook
Idioma:	inglés
Publicado:	Dordrecht : Springer Netherlands, 2005.
Series:	Education in the Asia-Pacific Region: Issues, Concerns and Prospects ; 4
Subjects:	Education. Distribution (Probability theory). Comparative education. Education (general). Comparative Education. Probability Theory and Stochastic Processes.
Acceso en liña:	http://dx.doi.org/10.1007/1-4020-3076-2
Tags:	Engadir etiqueta Sen Etiquetas, Sexa o primeiro en etiquetar este rexistro!

Imaxe de Portada

Applied Rasch Measurement: A Book of Exemplars Papers in Honour of John P. Keeves / por Maclean, Rupert

Publicado 2005.

Ligazón do recurso

Electrónico eBook