Applied Rasch Measurement: A Book of Exemplars Papers in Honour of John P. Keeves /

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Xehetasun bibliografikoak
Egile nagusia:	Maclean, Rupert
Erakunde egilea:	SpringerLink (Online service)
Beste egile batzuk:	Watanabe, Ryo, Baker, Robyn, Boediono, Cheng, Yin Cheong, Duncan, Wendy, Keeves, John, Mansheng, Zhou, Power, Colin, Rajput, J. S., Thaman, Konai Helu, Alagumalai, Sivakumar, Curtis, David D., Hungi, Njora
Formatua:	Baliabide elektronikoa eBook
Hizkuntza:	ingelesa
Argitaratua:	Dordrecht : Springer Netherlands, 2005.
Saila:	Education in the Asia-Pacific Region: Issues, Concerns and Prospects ; 4
Gaiak:	Education. Distribution (Probability theory). Comparative education. Education (general). Comparative Education. Probability Theory and Stochastic Processes.
Sarrera elektronikoa:	http://dx.doi.org/10.1007/1-4020-3076-2
Etiketak:	Etiketa erantsi Etiketarik gabe, Izan zaitez lehena erregistro honi etiketa jartzen!

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