Next generation HALT and HASS : robust design of electronics and systems /
Zapisane w:
| Główni autorzy: | , |
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| Format: | Elektroniczne E-book |
| Język: | angielski |
| Wydane: |
Chichester, West Sussex, United Kingdom ; Hoboken, NJ :
Wiley,
2016.
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| Seria: | Wiley series in quality and reliability engineering.
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| Hasła przedmiotowe: | |
| Dostęp online: | An electronic book accessible through the World Wide Web; click to view |
| Etykiety: |
Nie ma etykietki, Dołącz pierwszą etykiete!
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Spis treści:
- Basis and limitations of typical current reliability methods & metrics
- The need for reliability assurance metrics to change
- Challenges to advancing electronics reliability engineering
- A new deterministic reliability development paradigm
- Common understanding of HALT approach is critical for success
- The fundamentals of HALT
- Highly accelerated stress screening (HALT) and audits (HASA)
- HALT benefits for software/firmware performance and reliability
- Quantitative accelerated life test
- Failure analysis and corrective action
- Additional applications of HALT methods.