記錄引文
APA引文
Gray, K., & Paschkewitz, J. J. (2016). Next generation HALT and HASS: Robust design of electronics and systems. Wiley.
Successfully copied to clipboard
Copying to clipboard failed
Chicago Style (17th ed.) Citation
Gray, Kirk, and John James Paschkewitz. Next Generation HALT and HASS: Robust Design of Electronics and Systems. Chichester, West Sussex, United Kingdom ; Hoboken, NJ: Wiley, 2016.
Successfully copied to clipboard
Copying to clipboard failed
MLA引文
Gray, Kirk, and John James Paschkewitz. Next Generation HALT and HASS: Robust Design of Electronics and Systems. Wiley, 2016.
Successfully copied to clipboard
Copying to clipboard failed
警告:這些引文格式不一定是100%准確.