Tohutoro APA (7th ed.)
Gray, K., & Paschkewitz, J. J. (2016). Next generation HALT and HASS: Robust design of electronics and systems. Wiley.
Tohutoru Kātū Chicago (17th ed.)
Gray, Kirk, me John James Paschkewitz. Next Generation HALT and HASS: Robust Design of Electronics and Systems. Chichester, West Sussex, United Kingdom ; Hoboken, NJ: Wiley, 2016.
Tohutoro MLA (9th ed.)
Gray, Kirk, me John James Paschkewitz. Next Generation HALT and HASS: Robust Design of Electronics and Systems. Wiley, 2016.
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