Next generation HALT and HASS : robust design of electronics and systems /

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Bibliographic Details
Main Authors:	Gray, Kirk (Author), Paschkewitz, John James (Author)
Format:	Electronic eBook
Language:	English
Published:	Chichester, West Sussex, United Kingdom ; Hoboken, NJ : Wiley, 2016.
Series:	Wiley series in quality and reliability engineering.
Subjects:	Accelerated life testing. Electronic systems > Design and construction. Electronic systems > Testing. Electronic books.
Online Access:	An electronic book accessible through the World Wide Web; click to view
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