Advanced high speed devices

-д хадгалсан:

Номзүйн дэлгэрэнгүй
Байгууллагын зохиогчид:	IEEE/Cornell Conference on High Performance Devices Cornell University, ebrary, Inc
Бусад зохиолчид:	Shur, Michael S., Maki, Paul
Формат:	Цахим Бага хурлын үйл явц Цахим ном
Хэл сонгох:	англи
Хэвлэсэн:	Hackensack, N.J. : World Scientific, 2010.
Цуврал:	Selected topics in electronics and systems ; v. 51.
Нөхцлүүд:	Very high speed integrated circuits > Congresses. Semiconductors > Congresses. Transistors > Congresses. Integrated circuits > Very large scale integration > Congresses. Electronic books.
Онлайн хандалт:	An electronic book accessible through the World Wide Web; click to view
Шошгууд:	Шошго нэмэх Шошго байхгүй, Энэхүү баримтыг шошголох эхний хүн болох!

Ижил төстэй зүйлс: Advanced high speed devices

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Advanced semiconductor devices proceedings of the 2006 Lester Eastman Conference, Cornell, Ithaca, NY, USA, 26 August 2006 /
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High-speed integrated circuit technology towards 100 GHz logic /
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High performance devices proceedings of the 2004 IEEE Lester Eastman Conference on High Performance Devices, Rensselaer Polytechnic Institute, 4-6 August 2004 /
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An engineer's guide to automated testing of high-speed interfaces
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Design of analog-digital VLSI circuits for telecommunications and ... /
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VLSI test principles and architectures design for testability /
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Power-constrained testing of VLSI circuits
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Mixed analog-digital VLSI devices and technology
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High-speed heterostructure devices from device concepts to circuit modeling /
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VLSI circuits for biomedical applications
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VLSI custom microelectronics digital, analog, and mixed-signal /
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Mosfet modeling for VLSI simulation theory and practice /
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Radio frequency integrated circuit design
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Verification by error modeling using testing techniques in hardware verification /
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System-on-chip test architectures nanometer design for testability /
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Advanced interconnects for ULSI technology
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CMOS fractional-N synthesizers design for high spectral purity and monolithic integration /
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A one-semester course in modeling of VLSI interconnections /
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Wafer-level testing and test during burn-in for integrated circuits
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VLSI and computer architecture
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Signal integrity and radiated emission of high-speed digital systems