Advanced mathematical & computational tools in metrology & testing VIII

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Bibliographic Details
Corporate Authors: AMCTM VIII Paris, France, ebrary, Inc
Other Authors: Pavese, Franco
Format: Electronic Conference Proceeding eBook
Language:English
Published: Singapore ; Hackensack, NJ : World Scientific, c2009.
Series:Series on advances in mathematics for applied sciences ; v. 78.
Subjects:
Online Access:An electronic book accessible through the World Wide Web; click to view
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245 1 0 |a Advanced mathematical & computational tools in metrology & testing VIII  |h [electronic resource] /  |c editors, F. Pavese ... [et al.]. 
246 3 |a Advanced mathematical and computational tools in metrology and testing VIII 
246 3 |a AMCTM 8 
260 |a Singapore ;  |a Hackensack, NJ :  |b World Scientific,  |c c2009. 
300 |a xii, 406 p. :  |b ill. 
490 1 |a Series on advances in mathematics for applied sciences ;  |v v. 78 
504 |a Includes bibliographical references and index. 
533 |a Electronic reproduction.  |b Palo Alto, Calif. :  |c ebrary,  |d 2013.  |n Available via World Wide Web.  |n Access may be limited to ebrary affiliated libraries. 
650 0 |a Measurement  |v Congresses. 
650 0 |a Physical measurements  |v Congresses. 
650 0 |a Metrology  |v Congresses. 
655 7 |a Electronic books.  |2 local 
700 1 |a Pavese, Franco. 
710 2 |a ebrary, Inc. 
830 0 |a Series on advances in mathematics for applied sciences ;  |v v. 78. 
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