Advanced mathematical & computational tools in metrology & testing VIII

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Bibliographic Details
Corporate Authors: AMCTM VIII Paris, France, ebrary, Inc
Other Authors: Pavese, Franco
Format: Electronic Conference Proceeding eBook
Language:English
Published: Singapore ; Hackensack, NJ : World Scientific, c2009.
Series:Series on advances in mathematics for applied sciences ; v. 78.
Subjects:
Online Access:An electronic book accessible through the World Wide Web; click to view
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