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ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.

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Bibliographic Details
Corporate Authors: International Symposium for Testing and Failure Analysis Bellevue, Wash., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc
Format: Electronic Conference Proceeding eBook
Language:English
Published: Materials Park, OH : ASM International, c2000.
Subjects:
Electronics > Materials > Testing > Congresses.
Electronic apparatus and appliances > Testing > Congresses.
Electronic books.
Online Access:An electronic book accessible through the World Wide Web; click to view
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Description
Item Description:"Sponsored by EDFAS, ISTFA".
Physical Description:xvi, 577 p. : ill.
Bibliography:Includes bibliographical references and index.

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