Cita APA (7a ed.)
International Symposium for Testing and Failure Analysis Bellevue, Wash, ASM International, Electronic Device Failure Analysis Society, & ebrary, Inc. (2000). ISTFA 2000: Proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington. ASM International.
Cita Chicago Style (17a ed.)
International Symposium for Testing and Failure Analysis Bellevue, Wash, ASM International, Electronic Device Failure Analysis Society, y Inc ebrary. ISTFA 2000: Proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington. Materials Park, OH: ASM International, 2000.
Cita MLA (9a ed.)
International Symposium for Testing and Failure Analysis Bellevue, Wash, et al. ISTFA 2000: Proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington. ASM International, 2000.
Precaución: Estas citas no son 100% exactas.