Microelectronics failure analysis desk reference /
Sparad:
| Institutionellt upphov: | |
|---|---|
| Övriga upphov: | |
| Materialtyp: | Elektronisk E-bok |
| Språk: | engelska |
| Utgiven: |
Materials Park, Ohio :
ASM International,
c2011.
|
| Upplaga: | 6th ed. |
| Ämnen: | |
| Länkar: | An electronic book accessible through the World Wide Web; click to view |
| Taggar: |
Inga taggar, Lägg till första taggen!
|
Innehållsförteckning:
- section 1. Introduction
- section 2. Failure analysis process overviews
- section 3. Failure analysis topics
- section 4. Fault verification and classification
- section 5. Localization techniques
- section 6. Deprocessing and sample preparation
- section 7. Inspection
- section 8. Materials analysis
- section 9. Focused ion beam applications
- section 10. Management and reference information.