Microelectronics failure analysis desk reference /
Furkejuvvon:
| Searvvušdahkki: | |
|---|---|
| Eará dahkkit: | |
| Materiálatiipa: | Elektrovnnalaš E-girji |
| Giella: | eaŋgalasgiella |
| Almmustuhtton: |
Materials Park, Ohio :
ASM International,
c2011.
|
| Preanttus: | 6th ed. |
| Fáttát: | |
| Liŋkkat: | An electronic book accessible through the World Wide Web; click to view |
| Fáddágilkorat: |
Eai fáddágilkorat, Lasit vuosttaš fáddágilkora!
|
Sisdoallologahallan:
- section 1. Introduction
- section 2. Failure analysis process overviews
- section 3. Failure analysis topics
- section 4. Fault verification and classification
- section 5. Localization techniques
- section 6. Deprocessing and sample preparation
- section 7. Inspection
- section 8. Materials analysis
- section 9. Focused ion beam applications
- section 10. Management and reference information.