Microelectronics failure analysis desk reference /
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| Corporate Author: | |
|---|---|
| Other Authors: | |
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Materials Park, Ohio :
ASM International,
c2011.
|
| Edition: | 6th ed. |
| Subjects: | |
| Online Access: | An electronic book accessible through the World Wide Web; click to view |
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| 005 | 20171002062046.0 | ||
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| 007 | cr cn||||||||| | ||
| 008 | 120128s2011 ohua sbf 001 0 eng d | ||
| 010 | |z 2012359075 | ||
| 020 | |z 161503725X | ||
| 020 | |z 9781615037254 | ||
| 020 | |z 9781615037261 (e-book) | ||
| 035 | |a (CaPaEBR)ebr10540838 | ||
| 035 | |a (OCoLC)771901447 | ||
| 040 | |a CaPaEBR |c CaPaEBR | ||
| 050 | 1 | 4 | |a TK7871 |b .M52 2011eb |
| 082 | 0 | 4 | |a 621.381 |2 23 |
| 245 | 0 | 0 | |a Microelectronics failure analysis |h [electronic resource] : |b desk reference / |c edited by Richard J. Ross. |
| 250 | |a 6th ed. | ||
| 260 | |a Materials Park, Ohio : |b ASM International, |c c2011. | ||
| 300 | |a xi, 660 p. : |b ill. | ||
| 504 | |a Includes bibliographical references and indexes. | ||
| 505 | 0 | |a section 1. Introduction -- section 2. Failure analysis process overviews -- section 3. Failure analysis topics -- section 4. Fault verification and classification -- section 5. Localization techniques -- section 6. Deprocessing and sample preparation -- section 7. Inspection -- section 8. Materials analysis -- section 9. Focused ion beam applications -- section 10. Management and reference information. | |
| 533 | |a Electronic reproduction. |b Palo Alto, Calif. : |c ebrary, |d 2011. |n Available via World Wide Web. |n Access may be limited to ebrary affiliated libraries. | ||
| 650 | 0 | |a Electronics |x Materials |x Testing |v Handbooks, manuals, etc. | |
| 650 | 0 | |a Microelectronics |x Materials |x Testing |v Handbooks, manuals, etc. | |
| 650 | 0 | |a Microelectronics |x Materials |x Defects |v Handbooks, manuals, etc. | |
| 650 | 0 | |a Electronic apparatus and appliances |x Testing |v Handbooks, manuals, etc. | |
| 650 | 0 | |a Semiconductors |x Defects |v Handbooks, manuals, etc. | |
| 655 | 7 | |a Electronic books. |2 local | |
| 700 | 1 | |a Ross, Richard J. | |
| 710 | 2 | |a ebrary, Inc. | |
| 856 | 4 | 0 | |u http://site.ebrary.com/lib/daystar/Doc?id=10540838 |z An electronic book accessible through the World Wide Web; click to view |
| 908 | |a 170314 | ||
| 942 | 0 | 0 | |c EB |
| 999 | |c 135989 |d 135989 | ||