Microelectronics failure analysis desk reference /

Microelectronics failure analysis desk reference /

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Bibliographic Details
Corporate Author: ebrary, Inc
Other Authors: Ross, Richard J.
Format: Electronic eBook
Language:English
Published: Materials Park, Ohio : ASM International, c2011.
Edition:6th ed.
Subjects:
Electronics > Materials > Testing > Handbooks, manuals, etc.
Microelectronics > Materials > Testing > Handbooks, manuals, etc.
Microelectronics > Materials > Defects > Handbooks, manuals, etc.
Electronic apparatus and appliances > Testing > Handbooks, manuals, etc.
Semiconductors > Defects > Handbooks, manuals, etc.
Electronic books.
Online Access:An electronic book accessible through the World Wide Web; click to view
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Description
Physical Description:xi, 660 p. : ill.
Bibliography:Includes bibliographical references and indexes.

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