APA način citiranja (7. izdanje)
ebrary, Inc, & Nakamura, T. (2008). Terrestrial neutron-induced soft errors in advanced memory devices. World Scientific.
Čikaški stil citiranja (17. izdanje)
ebrary, Inc, i Takashi Nakamura. Terrestrial Neutron-induced Soft Errors in Advanced Memory Devices. Hackensack, NJ: World Scientific, 2008.
MLA način citiranja (9. izdanje)
ebrary, Inc, i Takashi Nakamura. Terrestrial Neutron-induced Soft Errors in Advanced Memory Devices. World Scientific, 2008.
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