APA(7版)引用形式
ebrary, Inc, & Nakamura, T. (2008). Terrestrial neutron-induced soft errors in advanced memory devices. World Scientific.
Chicagoスタイル(17版)引用形式
ebrary, Inc, , Takashi Nakamura. Terrestrial Neutron-induced Soft Errors in Advanced Memory Devices. Hackensack, NJ: World Scientific, 2008.
MLA(9版)引用形式
ebrary, Inc, , Takashi Nakamura. Terrestrial Neutron-induced Soft Errors in Advanced Memory Devices. World Scientific, 2008.
警告: この引用は必ずしも正確ではありません.