APA引文

ebrary, Inc, & Nakamura, T. (2008). Terrestrial neutron-induced soft errors in advanced memory devices. World Scientific.

Chicago Style (17th ed.) Citation

ebrary, Inc, and Takashi Nakamura. Terrestrial Neutron-induced Soft Errors in Advanced Memory Devices. Hackensack, NJ: World Scientific, 2008.

MLA引文

ebrary, Inc, and Takashi Nakamura. Terrestrial Neutron-induced Soft Errors in Advanced Memory Devices. World Scientific, 2008.