APA (7e ed.) Bronvermelding
ebrary, Inc, & Nakamura, T. (2008). Terrestrial neutron-induced soft errors in advanced memory devices. World Scientific.
Chicago (17e ed.) Bronvermelding
ebrary, Inc, en Takashi Nakamura. Terrestrial Neutron-induced Soft Errors in Advanced Memory Devices. Hackensack, NJ: World Scientific, 2008.
MLA (9e ed.) Bronvermelding
ebrary, Inc, en Takashi Nakamura. Terrestrial Neutron-induced Soft Errors in Advanced Memory Devices. World Scientific, 2008.
Let op: Deze citaties zijn niet altijd 100% accuraat.