ebrary, Inc, & Nakamura, T. (2008). Terrestrial neutron-induced soft errors in advanced memory devices. World Scientific.
Cita Chicago (17th ed.)ebrary, Inc, i Takashi Nakamura. Terrestrial Neutron-induced Soft Errors in Advanced Memory Devices. Hackensack, NJ: World Scientific, 2008.
Cita MLA (9th ed.)ebrary, Inc, i Takashi Nakamura. Terrestrial Neutron-induced Soft Errors in Advanced Memory Devices. World Scientific, 2008.
Atenció: Aquestes cites poden no estar 100% correctes.