Terrestrial neutron-induced soft errors in advanced memory devices
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| Autor Corporativo: | |
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| Formato: | Recurso Eletrônico livro eletrônico |
| Idioma: | inglês |
| Publicado em: |
Hackensack, NJ :
World Scientific,
c2008.
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| Assuntos: | |
| Acesso em linha: | An electronic book accessible through the World Wide Web; click to view |
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