Terrestrial neutron-induced soft errors in advanced memory devices
Bewaard in:
| Coauteur: | |
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| Andere auteurs: | |
| Formaat: | Elektronisch E-boek |
| Taal: | Engels |
| Gepubliceerd in: |
Hackensack, NJ :
World Scientific,
c2008.
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| Onderwerpen: | |
| Online toegang: | An electronic book accessible through the World Wide Web; click to view |
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