Terrestrial neutron-induced soft errors in advanced memory devices
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| Autor kompanije: | |
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| Daljnji autori: | |
| Format: | Elektronički e-knjiga |
| Jezik: | engleski |
| Izdano: |
Hackensack, NJ :
World Scientific,
c2008.
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| Teme: | |
| Online pristup: | An electronic book accessible through the World Wide Web; click to view |
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Slični predmeti: Terrestrial neutron-induced soft errors in advanced memory devices
- Terrestrial neutron-induced soft errors in advanced memory devices
- High performance memory testing design principles, fault modeling, and self-test /
- High performance memory testing design principles, fault modeling, and self-test /
- High density data storage principle, technology, and materials /
- High density data storage principle, technology, and materials /
- Non-volatile memories /