Terrestrial neutron-induced soft errors in advanced memory devices
Saved in:
| Corporate Author: | |
|---|---|
| Other Authors: | |
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Hackensack, NJ :
World Scientific,
c2008.
|
| Subjects: | |
| Online Access: | An electronic book accessible through the World Wide Web; click to view |
| Tags: |
No Tags, Be the first to tag this record!
|
Similar Items: Terrestrial neutron-induced soft errors in advanced memory devices
- High performance memory testing design principles, fault modeling, and self-test /
- High density data storage principle, technology, and materials /
- Non-volatile memories /
- Memory systems cache, DRAM, disk /
- Data Storage faster access to smaller bits.
- USB mass storage designing and programming devices and embedded hosts /