Scanning force microscopy with applications to electric, magnetic, and atomic forces /
Sábháilte in:
| Príomhchruthaitheoir: | |
|---|---|
| Údar corparáideach: | |
| Formáid: | Leictreonach Ríomhleabhar |
| Teanga: | Béarla |
| Foilsithe / Cruthaithe: |
New York :
Oxford University Press,
1994.
|
| Eagrán: | Rev. ed. |
| Sraith: | Oxford series in optical and imaging sciences ;
5. |
| Ábhair: | |
| Rochtain ar líne: | An electronic book accessible through the World Wide Web; click to view |
| Clibeanna: |
Cuir clib leis
Níl clibeanna ann, Bí ar an gcéad duine le clib a chur leis an taifead seo!
|
| Cur síos fisiciúil: | xiii, 263 p. : ill. |
|---|---|
| Leabharliosta: | Includes bibliographical references (p. 233-259) and index. |