Auger electron spectroscopy : practical application to materials analysis and characterization of surfaces, interfaces, and thin films /

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Bibliographic Details
Main Author:	Wolstenholme, John (Author)
Format:	Electronic eBook
Language:	English
Published:	New York, [New York] (222 East 46th Street, New York, NY 10017) : Momentum Press, 2015.
Series:	Materials characterization and analysis collection.
Subjects:	Auger electron spectroscopy. analytical methods Auger electron spectroscopy (AES) Auger spectrometers chemical imaging depth profiling energy analyzer interface analysis materials analysis microanalysis nanoanalysis scanning Auger microscopy (SAM) secondary electron microscopy spectrometer surface analysis surface sensitive surface specific thin film analysis ultrahigh vacuum
Online Access:	An electronic book accessible through the World Wide Web; click to view
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