A one-semester course in modeling of VLSI interconnections /
שמור ב:
| מחבר ראשי: | |
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| פורמט: | אלקטרוני ספר אלקטרוני |
| שפה: | אנגלית |
| יצא לאור: |
New York, [New York] (222 East 46th Street, New York, NY 10017) :
Momentum Press,
2015.
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| סדרה: | Electronic circuits and semiconductor devices collection.
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| נושאים: | |
| גישה מקוונת: | An electronic book accessible through the World Wide Web; click to view |
| תגים: |
הוספת תג
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| Abstract: | Quantitative understanding of the parasitic capacitances and inductances and the resultant propagation delays and crosstalk phenomena associated with the metallic interconnections on the very large scale integrated (VLSI) circuits has become extremely important for the optimum design of the state-of-the-art integrated circuits. It is because more than 65 percent of the delays on the integrated circuit chip occur in the interconnections and not in the transistors on the chip. Mathematical techniques to model the parasitic capacitances, inductances, propagation delays, crosstalk noise, and electromigration-induced failure associated with the interconnections in the realistic high-density environment on a chip will be discussed. An overview of the future interconnection technologies for the nanotechnology circuits will also be presented. This book will be the first book of its kind written for a one-semester course on the mathematical modeling of metallic interconnections on a VLSI circuit. In most institutions around the world offering BS, MS, and Ph.D. degrees in Electrical and Computer Engineering, such a course will be suitable for the first-year graduate students and it will also be appropriate as an elective course for senior level BS students. This book will also be of interest to practicing engineers in the field who are looking for a quick refresher on this subject. |
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| תיאור פיזי: | 1 online resource (xv, 340 pages) : illustrations. Also available in print. |
| פורמט: | Mode of access: World Wide Web. System requirements: Adobe Acrobat reader. |
| ביבליוגרפיה: | Includes bibliographical references and index. |
| ISBN: | 9781606505137 |
| ISSN: | 2376-4848 |
| גישה: | Restricted to libraries which purchase an unrestricted PDF download via an IP. |