X-ray fluorescence spectrometry and related techniques an introduction /
X-ray fluorescence spectrometry (XRF) is a well-established analytical technique for qualitative and quantitative elemental analysis of a wide variety of routine quality control and research samples. Among its many desirable features, it delivers true multi-element character analysis, acceptable spe...
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| Other Authors: | |
| Format: | Electronic eBook |
| Language: | English |
| Published: |
[New York, N.Y.] (222 East 46th Street, New York, NY 10017) :
Momentum Press,
2013.
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| Subjects: | |
| Online Access: | An electronic book accessible through the World Wide Web; click to view |
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| LEADER | 00000nam a2200000 a 4500 | ||
|---|---|---|---|
| 001 | ebr10661538 | ||
| 003 | CaPaEBR | ||
| 005 | 20180830115320.0 | ||
| 006 | m eo d | ||
| 007 | cr cn |||m|||a | ||
| 008 | 130222s2013 nyua foab 001 0 eng d | ||
| 020 | |a 9781606503935 (electronic bk.) | ||
| 020 | |a 1606503936 (electronic bk.) | ||
| 020 | |z 9781606503911 (print) | ||
| 020 | |z 160650391X (print) | ||
| 024 | 7 | |a 10.5643/9781606503935 |2 doi | |
| 040 | |a CaBNVSL |c CaBNVSL |d CaBNVSL | ||
| 035 | |a (OCoLC)829322779 | ||
| 050 | 4 | |a QC482.S6 |b M278 2013 | |
| 082 | 0 | 4 | |a 537.5352 |2 23 |
| 100 | 1 | |a Margu�i, Eva. | |
| 245 | 1 | 0 | |a X-ray fluorescence spectrometry and related techniques |h [electronic resource] : |b an introduction / |c Eva Margu�i, Ren�e Van Grieken. |
| 260 | |a [New York, N.Y.] (222 East 46th Street, New York, NY 10017) : |b Momentum Press, |c 2013. | ||
| 300 | |a 1 electronic text (xv, 142 p.) : |b ill., digital file. | ||
| 504 | |a Includes bibliographical references (p. 133-138) and index. | ||
| 505 | 0 | |a Preface -- Series preface -- Series editor -- About the authors -- | |
| 505 | 8 | |a 1. Introduction -- 1.1 Basic principles of x-ray fluorescence -- 1.2 Interactions of x-rays with matter -- 1.3 X-ray safety and protection -- | |
| 505 | 8 | |a 2. Basic components of x-ray fluorescence spectrometers -- 2.1 General introduction -- 2.2 Excitation sources -- 2.2.1 X-ray tubes -- 2.2.2 Radioisotopes -- 2.2.3 Other sources -- 2.3 Sample chamber -- 2.4 Detection system -- 2.4.1 Types of detectors -- 2.4.1.1 Gas-filled detectors -- 2.4.1.2 Scintillation detectors -- 2.4.1.3 Solid-state detectors -- 2.4.2 Resolution and efficiency -- 2.4.2.1 Resolution -- 2.4.2.2 Efficiency -- 2.4.3 Comparison of detection systems -- 2.4.4 Detector artifacts -- 2.4.4.1 Escape peaks -- 2.4.4.2 Sum peaks (pile-up effect) -- 2.4.5 Signal processing system -- 2.5 Source and detector modifiers -- 2.5.1 Filters -- 2.5.1.1 Primary filters -- 2.5.1.2 Detector filters -- 2.5.2 Secondary targets -- 2.5.3 Focusing optics -- 2.5.4 Dispersing systems -- 2.5.5 Collimators -- 2.5.6 Masks -- 2.6 Instrument configurations -- | |
| 505 | 8 | |a 3. Qualitative and quantitative x-ray fluorescence analysis -- 3.1 Evaluation of x-ray fluorescence spectra -- 3.2 Qualitative XRF analysis -- 3.3 Quantitative XRF analysis -- 3.3.1 Chemical matrix effects -- 3.3.1.1 Absorption effects -- 3.3.1.2 Enhancement effects -- 3.3.2 Correction and compensation methods -- 3.3.2.1 Compensation methods -- 3.3.2.2 Matrix correction methods -- 3.3.2.3 Overview of correction and compensation methods -- 3.3.3 Quality of XRF analytical results -- 3.3.3.1 Limits of detection (LOD) and quantification (LOQ) -- 3.3.3.2 Working range and linearity -- 3.3.3.3 Precision and accuracy -- 3.3.3.4 Quality control of the results -- | |
| 505 | 8 | |a 4. Sample preparation procedures -- 4.1 Introduction -- 4.2 General sample preparation procedures -- 4.2.1 Solid samples -- 4.2.1.1 Direct XRF analysis -- 4.2.1.2 Powdered specimen -- 4.2.1.3 Fused specimen -- 4.2.1.4 Digested specimen -- 4.2.2 Liquid samples -- 4.2.2.1 Preconcentration methods -- 4.3 Specific sample preparation procedures -- | |
| 505 | 8 | |a 5. Wavelength/energy dispersive x-ray fluorescence spectrometry (WDXRF/EDXRF) -- 5.1 Introduction and basic principles -- 5.2 WDXRF and EDXRF layouts -- 5.2.1 WDXRF instrumentation -- 5.2.2 EDXRF instrumentation -- 5.3 Comparison of WDXRF and EDXRF systems -- 5.4 Applications of WDXRF and case studies -- 5.4.1 Determination of metal residues in active pharmaceutical ingredients -- 5.4.2 Determination of heavy metal content in automotive -- shredder residues (ASR) -- 5.4.3 Metal determination in polluted soils and waters -- 5.5 Applications of EDXRF and case studies -- 5.5.1 Determination of heavy metals at trace levels in vegetation samples -- 5.5.2 Determination of Cu, Ni, Zn, Pb, and Cd in aqueous samples -- 5.5.3 Chemical characterization of aerosol samples -- | |
| 505 | 8 | |a 6. Total Reflection X-Ray Spectrometry (TXRF) -- 6.1 Introduction and basic principles -- 6.2 TXRF layout -- 6.3 Analytical capabilities of TXRF systems -- 6.3.1 Chemical analysis -- 6.3.1.1 Sample carriers -- 6.3.1.2 Sample treatment procedures for chemical analysis by TXRF -- 6.3.1.3 Quantification -- 6.3.2 Surface analysis -- 6.4 Other applications of TXRF and case studies -- 6.4.1 Multielement determination in waste water effluents -- 6.4.2 Determination of trace amounts of Se in soil samples -- 6.4.3 Analysis of Si wafer surfaces -- | |
| 505 | 8 | |a 7. Special XRF configurations and related techniques -- 7.1 Introduction -- 7.2 Microbeam X-ray fluorescence spectrometry ([mu]-XRF) -- 7.3 Synchrotron radiation-induced X-ray emission (SRXRF or SRIXE) -- 7.4 Particle-induced X-ray emission (PIXE) -- 7.5 Electron-induced X-ray emission -- 7.5.1 Scanning electron microscope (SEM) -- 7.5.2 Electron microprobe analysis (EMPA) -- | |
| 505 | 8 | |a 8. Overview of XRF and related techniques -- 8.1 Introduction -- 8.2 Comparative performance of XRF systems -- 8.3 Role of XRF spectrometry in analysis field -- 8.4 Future perspectives -- | |
| 505 | 8 | |a Buyer's guide to manufacturers -- Glossary of abbreviations and acronyms -- References -- Bibliography -- Books and encyclopedia chapters -- Journals -- Index. | |
| 506 | 1 | |a Restricted to libraries which purchase an unrestricted PDF download via an IP. | |
| 520 | 3 | |a X-ray fluorescence spectrometry (XRF) is a well-established analytical technique for qualitative and quantitative elemental analysis of a wide variety of routine quality control and research samples. Among its many desirable features, it delivers true multi-element character analysis, acceptable speed and economy, easy of automation, and the capacity to analyze solid samples. This remarkable contribution to this field provides a comprehensive and up-to-date account of basic principles, recent developments, instrumentation, sample preparation procedures, and applications of XRF analysis. If you are a professional in materials science, analytic chemistry, or physics, you will benefit from not only the review of basics, but also the newly developed technologies with XRF. | |
| 530 | |a Also available in print. | ||
| 538 | |a Mode of access: World Wide Web. | ||
| 538 | |a System requirements: Adobe Acrobat reader. | ||
| 588 | |a Title from PDF t.p. (viewed on February 22, 2013). | ||
| 650 | 0 | |a X-ray spectroscopy. | |
| 653 | |a X-ray fluorescence spectrometry (XRF) | ||
| 653 | |a Energy dispersive X-ray fluorescence spectrometry (EDXRF) | ||
| 653 | |a Wavelength dispersive X-ray fluorescence spectrometry (WDXRF) | ||
| 653 | |a Total reflection X-ray fluorescence spectrometry (TXRF) | ||
| 653 | |a Micro-XRF | ||
| 653 | |a Synchrotron radiation-induced X-ray emission (SRXRF) | ||
| 653 | |a Metals | ||
| 653 | |a Sample preparation | ||
| 653 | |a XRF instrumentation | ||
| 653 | |a Industrial analysis | ||
| 653 | |a Environmental analysis | ||
| 653 | |a Geochemical analysis | ||
| 700 | 1 | |a Grieken, R. van (Ren�e) | |
| 776 | 0 | 8 | |i Print version: |z 160650391X |z 9781606503911 |
| 856 | 4 | 0 | |u http://site.ebrary.com/lib/daystar/Doc?id=10661538 |z An electronic book accessible through the World Wide Web; click to view |
| 999 | |c 197542 |d 197542 | ||
Total-reflection x-ray fluorescence analysis and related methods /