X-ray fluorescence spectrometry and related techniques an introduction /

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Bibliografiske detaljer
Hovedforfatter: Margu�i, Eva
Andre forfattere: Grieken, R. van (Ren�e)
Format: Electronisk eBog
Sprog:engelsk
Udgivet: [New York, N.Y.] (222 East 46th Street, New York, NY 10017) : Momentum Press, 2013.
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Online adgang:An electronic book accessible through the World Wide Web; click to view
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Beskrivelse
Abstract:X-ray fluorescence spectrometry (XRF) is a well-established analytical technique for qualitative and quantitative elemental analysis of a wide variety of routine quality control and research samples. Among its many desirable features, it delivers true multi-element character analysis, acceptable speed and economy, easy of automation, and the capacity to analyze solid samples. This remarkable contribution to this field provides a comprehensive and up-to-date account of basic principles, recent developments, instrumentation, sample preparation procedures, and applications of XRF analysis. If you are a professional in materials science, analytic chemistry, or physics, you will benefit from not only the review of basics, but also the newly developed technologies with XRF.
Fysisk beskrivelse:1 electronic text (xv, 142 p.) : ill., digital file.
Also available in print.
Format:Mode of access: World Wide Web.
System requirements: Adobe Acrobat reader.
Bibliografi:Includes bibliographical references (p. 133-138) and index.
ISBN:9781606503935 (electronic bk.)
1606503936 (electronic bk.)
Adgang:Restricted to libraries which purchase an unrestricted PDF download via an IP.