X-ray fluorescence spectrometry and related techniques an introduction /
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| Autor Principal: | |
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| Outros autores: | |
| Formato: | Electrónico eBook |
| Idioma: | inglés |
| Publicado: |
[New York, N.Y.] (222 East 46th Street, New York, NY 10017) :
Momentum Press,
2013.
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| Subjects: | |
| Acceso en liña: | An electronic book accessible through the World Wide Web; click to view |
| Tags: |
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| Resumo: | X-ray fluorescence spectrometry (XRF) is a well-established analytical technique for qualitative and quantitative elemental analysis of a wide variety of routine quality control and research samples. Among its many desirable features, it delivers true multi-element character analysis, acceptable speed and economy, easy of automation, and the capacity to analyze solid samples. This remarkable contribution to this field provides a comprehensive and up-to-date account of basic principles, recent developments, instrumentation, sample preparation procedures, and applications of XRF analysis. If you are a professional in materials science, analytic chemistry, or physics, you will benefit from not only the review of basics, but also the newly developed technologies with XRF. |
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| Descrición Física: | 1 electronic text (xv, 142 p.) : ill., digital file. Also available in print. |
| Formato: | Mode of access: World Wide Web. System requirements: Adobe Acrobat reader. |
| Bibliografía: | Includes bibliographical references (p. 133-138) and index. |
| ISBN: | 9781606503935 (electronic bk.) 1606503936 (electronic bk.) |
| Acceso: | Restricted to libraries which purchase an unrestricted PDF download via an IP. |