X-ray fluorescence spectrometry and related techniques an introduction /

X-ray fluorescence spectrometry and related techniques an introduction /

X-ray fluorescence spectrometry (XRF) is a well-established analytical technique for qualitative and quantitative elemental analysis of a wide variety of routine quality control and research samples. Among its many desirable features, it delivers true multi-element character analysis, acceptable spe...

Full description

Saved in:
Bibliographic Details
Main Author: Margu�i, Eva
Other Authors: Grieken, R. van (Ren�e)
Format: Electronic eBook
Language:English
Published: [New York, N.Y.] (222 East 46th Street, New York, NY 10017) : Momentum Press, 2013.
Subjects:
X-ray spectroscopy.
X-ray fluorescence spectrometry (XRF)
Energy dispersive X-ray fluorescence spectrometry (EDXRF)
Wavelength dispersive X-ray fluorescence spectrometry (WDXRF)
Total reflection X-ray fluorescence spectrometry (TXRF)
Micro-XRF
Synchrotron radiation-induced X-ray emission (SRXRF)
Metals
Sample preparation
XRF instrumentation
Industrial analysis
Environmental analysis
Geochemical analysis
Online Access:An electronic book accessible through the World Wide Web; click to view
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:X-ray fluorescence spectrometry (XRF) is a well-established analytical technique for qualitative and quantitative elemental analysis of a wide variety of routine quality control and research samples. Among its many desirable features, it delivers true multi-element character analysis, acceptable speed and economy, easy of automation, and the capacity to analyze solid samples. This remarkable contribution to this field provides a comprehensive and up-to-date account of basic principles, recent developments, instrumentation, sample preparation procedures, and applications of XRF analysis. If you are a professional in materials science, analytic chemistry, or physics, you will benefit from not only the review of basics, but also the newly developed technologies with XRF.
Physical Description:1 electronic text (xv, 142 p.) : ill., digital file.
Also available in print.
Format:Mode of access: World Wide Web.
System requirements: Adobe Acrobat reader.
Bibliography:Includes bibliographical references (p. 133-138) and index.
ISBN:9781606503935 (electronic bk.)
1606503936 (electronic bk.)
Access:Restricted to libraries which purchase an unrestricted PDF download via an IP.

Similar Items