Characterization of high Tc materials and devices by electron microscopy

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Bibliographic Details
Corporate Author: ebrary, Inc
Other Authors: Browning, Nigel D., Pennycook, Stephen J.
Format: Electronic eBook
Language:English
Published: Cambridge ; New York : Cambridge University Press, 2000.
Subjects:
Online Access:An electronic book accessible through the World Wide Web; click to view
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020 |z 052155490X (hb) 
035 |a (CaPaEBR)ebr10065742 
035 |a (OCoLC)228069387 
040 |a CaPaEBR  |c CaPaEBR 
050 1 4 |a QC611.98.H54  |b C43 2000eb 
082 0 4 |a 537.6/23/0284  |2 21 
245 0 0 |a Characterization of high Tc materials and devices by electron microscopy  |h [electronic resource] /  |c edited by Nigel D. Browning, Stephen J. Pennycook. 
260 |a Cambridge ;  |a New York :  |b Cambridge University Press,  |c 2000. 
300 |a xii, 391 p. :  |b ill. 
504 |a Includes bibliographical references. 
533 |a Electronic reproduction.  |b Palo Alto, Calif. :  |c ebrary,  |d 2013.  |n Available via World Wide Web.  |n Access may be limited to ebrary affiliated libraries. 
650 0 |a High temperature superconductors. 
650 0 |a Electron microscopy  |x Technique. 
655 7 |a Electronic books.  |2 local 
700 1 |a Browning, Nigel D. 
700 1 |a Pennycook, Stephen J. 
710 2 |a ebrary, Inc. 
856 4 0 |u http://site.ebrary.com/lib/daystar/Doc?id=10065742  |z An electronic book accessible through the World Wide Web; click to view 
908 |a 170314 
942 0 0 |c EB 
999 |c 64463  |d 64463