Beam effects, surface topography, and depth profiling in surface analysis

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Bibliographic Details
Corporate Author: ebrary, Inc
Other Authors: Czanderna, Alvin Warren, 1930-, Madey, Theodore E., Powell, C. J. (Cedric John)
Format: Electronic eBook
Language:English
Published: New York : Plenum Press, c1998.
Series:Methods of surface characterization ; v. 5.
Subjects:
Online Access:An electronic book accessible through the World Wide Web; click to view
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035 |a (CaPaEBR)ebr10046976 
035 |a (OCoLC)229449306 
040 |a CaPaEBR  |c CaPaEBR 
050 1 4 |a TA418.7  |b .B43 1998eb 
082 0 4 |a 620/.44  |2 21 
245 0 0 |a Beam effects, surface topography, and depth profiling in surface analysis  |h [electronic resource] /  |c edited by Alvin W. Czanderna, Theodore E. Madey and Cedric J. Powell. 
260 |a New York :  |b Plenum Press,  |c c1998. 
300 |a xix, 430 p. :  |b ill. 
490 1 |a Methods of surface characterization ;  |v v. 5 
504 |a Includes bibliographical references and index. 
533 |a Electronic reproduction.  |b Palo Alto, Calif. :  |c ebrary,  |d 2013.  |n Available via World Wide Web.  |n Access may be limited to ebrary affiliated libraries. 
650 0 |a Surfaces (Technology)  |x Analysis. 
650 0 |a Materials  |x Effect of radiation on. 
655 7 |a Electronic books.  |2 local 
700 1 |a Czanderna, Alvin Warren,  |d 1930- 
700 1 |a Madey, Theodore E. 
700 1 |a Powell, C. J.  |q (Cedric John) 
710 2 |a ebrary, Inc. 
830 0 |a Methods of surface characterization ;  |v v. 5. 
856 4 0 |u http://site.ebrary.com/lib/daystar/Doc?id=10046976  |z An electronic book accessible through the World Wide Web; click to view 
908 |a 170314 
942 0 0 |c EB 
999 |c 58907  |d 58907