Digital System Test and Testable Design Using HDL Models and Architectures /
Kaydedildi:
| Yazar: | |
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| Müşterek Yazar: | |
| Materyal Türü: | Elektronik Ekitap |
| Dil: | İngilizce |
| Baskı/Yayın Bilgisi: |
Boston, MA :
Springer US,
2011.
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| Konular: | |
| Online Erişim: | http://dx.doi.org/10.1007/978-1-4419-7548-5 |
| Etiketler: |
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