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Auger electron spectroscopy : practical application to materials analysis and characterization of surfaces, interfaces, and thin films /

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Номзүйн дэлгэрэнгүй
Үндсэн зохиолч:	Wolstenholme, John (Зохиогч)
Формат:	Цахим Цахим ном
Хэл сонгох:	англи
Хэвлэсэн:	New York, [New York] (222 East 46th Street, New York, NY 10017) : Momentum Press, 2015.
Цуврал:	Materials characterization and analysis collection.
Нөхцлүүд:	Auger electron spectroscopy. analytical methods Auger electron spectroscopy (AES) Auger spectrometers chemical imaging depth profiling energy analyzer interface analysis materials analysis microanalysis nanoanalysis scanning Auger microscopy (SAM) secondary electron microscopy spectrometer surface analysis surface sensitive surface specific thin film analysis ultrahigh vacuum
Онлайн хандалт:	An electronic book accessible through the World Wide Web; click to view
Шошгууд:	Шошго нэмэх Шошго байхгүй, Энэхүү баримтыг шошголох эхний хүн болох!

Нүүр зураг

Auger electron spectroscopy : practical application to materials analysis and characterization of surfaces, interfaces, and thin films / -н Wolstenholme, John

Хэвлэсэн 2015

An electronic book accessible through the World Wide Web; click to view

Цахим Цахим ном