Auger electron spectroscopy : practical application to materials analysis and characterization of surfaces, interfaces, and thin films /
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| 主要作者: | |
|---|---|
| 格式: | 电子 电子书 |
| 语言: | 英语 |
| 出版: |
New York, [New York] (222 East 46th Street, New York, NY 10017) :
Momentum Press,
2015.
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| 丛编: | Materials characterization and analysis collection.
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| 主题: | |
| 在线阅读: | An electronic book accessible through the World Wide Web; click to view |
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书本目录:
- 1. Introduction
- 2. The interaction of electrons with solid materials
- 3. AES methodologies
- 4. Instrumentation for auger analysis
- 5. Auger electron spectroscopy in materials analysis
- 6. Analytical methods for the characterization of materials
- Appendix 1. Abbreviations and acronyms
- Appendix 2. Quantum numbers
- Appendix 3. Comparison of surface and thin film analysis techniques
- Appendix 4. Standardization in surface analysis
- Appendix 5. Sources of the figures
- Further reading
- Index.