ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis : November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA /
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| Corporate Author: | |
|---|---|
| Format: | Electronic Conference Proceeding eBook |
| Language: | English |
| Published: |
Materials Park, Ohio :
ASM International,
[2015]
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| Subjects: | |
| Online Access: | An electronic book accessible through the World Wide Web; click to view |
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| 111 | 2 | |a International Symposium for Testing and Failure Analysis |n (41st : |d 2015 : |c Portland, Oregon), |j organizer. | |
| 245 | 1 | 0 | |a ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis : |b November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA / |c organized by ISTFA/2015, Electronic Device Failure Analysis Society (EDFAS), ASM International. |
| 264 | 1 | |a Materials Park, Ohio : |b ASM International, |c [2015] | |
| 264 | 4 | |c ©2015 | |
| 300 | |a 1 online resource (536 pages) : |b illustrations (some color) | ||
| 336 | |a text |2 rdacontent | ||
| 337 | |a computer |2 rdamedia | ||
| 338 | |a online resource |2 rdacarrier | ||
| 500 | |a Cover title. | ||
| 588 | |a Description based on online resource; title from PDF title page (ebrary, viewed March 14, 2016). | ||
| 590 | |a Electronic reproduction. Ann Arbor, MI : ProQuest, 2016. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. | ||
| 650 | 0 | |a Electronics |x Materials |x Testing |v Congresses. | |
| 650 | 0 | |a Materials |x Testing |v Congresses. | |
| 650 | 0 | |a Electronic apparatus and appliances |x Testing |v Congresses. | |
| 650 | 0 | |a Semiconductors |x Testing |v Congresses. | |
| 655 | 4 | |a Electronic books. | |
| 710 | 2 | |a ASM International, |e organizer. | |
| 710 | 2 | |a Electronic Device Failure Analysis Society, |e organizer. | |
| 797 | 2 | |a ProQuest (Firm) | |
| 856 | 4 | 0 | |u http://site.ebrary.com/lib/daystar/Doc?id=11160634 |z An electronic book accessible through the World Wide Web; click to view |
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| 999 | |c 186556 |d 186556 | ||