Monte Carlo modeling for electron microscopy and microanalysis

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Bibliographic Details
Main Author: Joy, David C., 1943-
Corporate Author: ebrary, Inc
Format: Electronic eBook
Language:English
Published: New York : Oxford University Press, 1995.
Series:Oxford series in optical and imaging sciences ; 9.
Subjects:
Online Access:An electronic book accessible through the World Wide Web; click to view
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010 |z  94035642 
020 |z 0195088743 (acid-free paper) 
020 |z 9780195088748 
035 |a (CaPaEBR)ebr10358552 
035 |a (OCoLC)435816746 
040 |a CaPaEBR  |c CaPaEBR 
050 1 4 |a QH212.E4  |b J67 1995eb 
082 0 4 |a 502/.8/25  |2 20 
100 1 |a Joy, David C.,  |d 1943- 
245 1 0 |a Monte Carlo modeling for electron microscopy and microanalysis  |h [electronic resource] /  |c David C. Joy. 
260 |a New York :  |b Oxford University Press,  |c 1995. 
300 |a viii, 216 p. :  |b ill. 
490 1 |a Oxford series in optical and imaging sciences ;  |v 9 
504 |a Includes bibliographical references. 
533 |a Electronic reproduction.  |b Palo Alto, Calif. :  |c ebrary,  |d 2011.  |n Available via World Wide Web.  |n Access may be limited to ebrary affiliated libraries. 
650 0 |a Electron microscopy  |x Computer simulation. 
650 0 |a Electron probe microanalysis  |x Computer simulation. 
650 0 |a Monte Carlo method. 
655 7 |a Electronic books.  |2 local 
710 2 |a ebrary, Inc. 
830 0 |a Oxford series in optical and imaging sciences ;  |v 9. 
856 4 0 |u http://site.ebrary.com/lib/daystar/Doc?id=10358552  |z An electronic book accessible through the World Wide Web; click to view 
908 |a 170314 
942 0 0 |c EB 
999 |c 104952  |d 104952