Microelectronic failure analysis desk reference. 2002 supplement /

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Bibliographic Details
Corporate Authors: Electronic Device Failure Analysis Society, ebrary, Inc
Format: Electronic eBook
Language:English
Published: Materials Park, OH : ASM International, c2002.
Subjects:
Online Access:An electronic book accessible through the World Wide Web; click to view
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LEADER 00000nam a2200000Ia 4500
001 0000112982
005 20171002055943.0
006 m u
007 cr cn|||||||||
008 021220s2002 ohua sbf 001 0 eng d
020 |z 0871707691 
020 |z 9780871707697 
035 |a (CaPaEBR)ebr10330016 
035 |a (OCoLC)609419839 
040 |a CaPaEBR  |c CaPaEBR 
050 1 4 |a TK7871  |b .M52 2002eb 
245 0 0 |a Microelectronic failure analysis  |h [electronic resource] :  |b desk reference.  |p 2002 supplement /  |c prepared under the direction of the Electronic Device Failure Analysis Society publications committee. 
260 |a Materials Park, OH :  |b ASM International,  |c c2002. 
300 |a vi, 210 p. :  |b ill. 
504 |a Includes bibliographical references and index. 
533 |a Electronic reproduction.  |b Palo Alto, Calif. :  |c ebrary,  |d 2009.  |n Available via World Wide Web.  |n Access may be limited to ebrary affiliated libraries. 
650 0 |a Electronic apparatus and appliances  |x Testing  |v Handbooks, manuals, etc. 
650 0 |a Electronics  |x Materials  |x Testing  |v Handbooks, manuals, etc. 
650 0 |a Microelectronics  |x Materials  |x Defects  |v Handbooks, manuals, etc. 
650 0 |a Microelectronics  |x Materials  |x Testing  |v Handbooks, manuals, etc. 
650 0 |a Semiconductors  |x Defects  |v Handbooks, manuals, etc. 
655 7 |a Electronic books.  |2 local 
710 2 |a Electronic Device Failure Analysis Society. 
710 2 |a ebrary, Inc. 
856 4 0 |u http://site.ebrary.com/lib/daystar/Doc?id=10330016  |z An electronic book accessible through the World Wide Web; click to view 
908 |a 170314 
942 0 0 |c EB 
999 |c 102132  |d 102132