ESD failure mechanisms and models /
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| Main Author: | |
|---|---|
| Corporate Author: | |
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Chichester, West Sussex, U.K. ; Hoboken, NJ :
J. Wiley,
2009.
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| Subjects: | |
| Online Access: | An electronic book accessible through the World Wide Web; click to view |
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| 007 | cr cn||||||||| | ||
| 008 | 090423s2009 enk sb 001 0 eng d | ||
| 010 | |z 2009015206 | ||
| 020 | |z 9780470511374 (cloth) | ||
| 035 | |a (CaPaEBR)ebr10317806 | ||
| 035 | |a (OCoLC)441888589 | ||
| 040 | |a CaPaEBR |c CaPaEBR | ||
| 050 | 1 | 4 | |a TK7871.852 |b .V65 2009eb |
| 082 | 0 | 4 | |a 621.381 |2 22 |
| 100 | 1 | |a Voldman, Steven H. | |
| 245 | 1 | 0 | |a ESD |h [electronic resource] : |b failure mechanisms and models / |c Steven H. Voldman. |
| 246 | 3 | |a Electrostatic discharge | |
| 260 | |a Chichester, West Sussex, U.K. ; |a Hoboken, NJ : |b J. Wiley, |c 2009. | ||
| 300 | |a xxiv, 384 p. | ||
| 504 | |a Includes bibliographical references and index. | ||
| 533 | |a Electronic reproduction. |b Palo Alto, Calif. : |c ebrary, |d 2009. |n Available via World Wide Web. |n Access may be limited to ebrary affiliated libraries. | ||
| 650 | 0 | |a Semiconductors |x Failures. | |
| 650 | 0 | |a Integrated circuits |x Protection. | |
| 650 | 0 | |a Integrated circuits |x Testing. | |
| 650 | 0 | |a Integrated circuits |x Reliability. | |
| 650 | 0 | |a Electric discharges. | |
| 650 | 0 | |a Electrostatics. | |
| 655 | 7 | |a Electronic books. |2 local | |
| 710 | 2 | |a ebrary, Inc. | |
| 856 | 4 | 0 | |u http://site.ebrary.com/lib/daystar/Doc?id=10317806 |z An electronic book accessible through the World Wide Web; click to view |
| 908 | |a 170314 | ||
| 942 | 0 | 0 | |c EB |
| 999 | |c 101050 |d 101050 | ||