Next generation HALT and HASS : robust design of electronics and systems /

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书目详细资料
Main Authors:	Gray, Kirk (Author), Paschkewitz, John James (Author)
格式:	电子电子书
语言:	英语
出版:	Chichester, West Sussex, United Kingdom ; Hoboken, NJ : Wiley, 2016.
丛编:	Wiley series in quality and reliability engineering.
主题:	Accelerated life testing. Electronic systems > Design and construction. Electronic systems > Testing. Electronic books.
在线阅读:	An electronic book accessible through the World Wide Web; click to view
标签:	添加标签没有标签, 成为第一个标记此记录!

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