Next generation HALT and HASS : robust design of electronics and systems /
I tiakina i:
| Ngā kaituhi matua: | , |
|---|---|
| Hōputu: | Tāhiko īPukapuka |
| Reo: | Ingarihi |
| I whakaputaina: |
Chichester, West Sussex, United Kingdom ; Hoboken, NJ :
Wiley,
2016.
|
| Rangatū: | Wiley series in quality and reliability engineering.
|
| Ngā marau: | |
| Urunga tuihono: | An electronic book accessible through the World Wide Web; click to view |
| Ngā Tūtohu: |
Tāpirihia he Tūtohu
Kāore He Tūtohu, Me noho koe te mea tuatahi ki te tūtohu i tēnei pūkete!
|
Rārangi ihirangi:
- Basis and limitations of typical current reliability methods & metrics
- The need for reliability assurance metrics to change
- Challenges to advancing electronics reliability engineering
- A new deterministic reliability development paradigm
- Common understanding of HALT approach is critical for success
- The fundamentals of HALT
- Highly accelerated stress screening (HALT) and audits (HASA)
- HALT benefits for software/firmware performance and reliability
- Quantitative accelerated life test
- Failure analysis and corrective action
- Additional applications of HALT methods.