कवर छवि

Next generation HALT and HASS : robust design of electronics and systems /

में बचाया:
ग्रंथसूची विवरण
मुख्य लेखकों: Gray, Kirk (लेखक), Paschkewitz, John James (लेखक)
स्वरूप: इलेक्ट्रोनिक ई-पुस्तक
भाषा:अंग्रेज़ी
प्रकाशित: Chichester, West Sussex, United Kingdom ; Hoboken, NJ : Wiley, 2016.
श्रृंखला:Wiley series in quality and reliability engineering.
विषय:
Accelerated life testing.
Electronic systems > Design and construction.
Electronic systems > Testing.
Electronic books.
ऑनलाइन पहुंच:An electronic book accessible through the World Wide Web; click to view
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विषय - सूची:
  • Basis and limitations of typical current reliability methods & metrics
  • The need for reliability assurance metrics to change
  • Challenges to advancing electronics reliability engineering
  • A new deterministic reliability development paradigm
  • Common understanding of HALT approach is critical for success
  • The fundamentals of HALT
  • Highly accelerated stress screening (HALT) and audits (HASA)
  • HALT benefits for software/firmware performance and reliability
  • Quantitative accelerated life test
  • Failure analysis and corrective action
  • Additional applications of HALT methods.

समान संसाधन