תמונות העטיפה

Next generation HALT and HASS : robust design of electronics and systems /

שמור ב:
מידע ביבליוגרפי
Main Authors: Gray, Kirk (Author), Paschkewitz, John James (Author)
פורמט: אלקטרוני ספר אלקטרוני
שפה:אנגלית
יצא לאור: Chichester, West Sussex, United Kingdom ; Hoboken, NJ : Wiley, 2016.
סדרה:Wiley series in quality and reliability engineering.
נושאים:
Accelerated life testing.
Electronic systems > Design and construction.
Electronic systems > Testing.
Electronic books.
גישה מקוונת:An electronic book accessible through the World Wide Web; click to view
תגים: הוספת תג
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תוכן הענינים:
  • Basis and limitations of typical current reliability methods & metrics
  • The need for reliability assurance metrics to change
  • Challenges to advancing electronics reliability engineering
  • A new deterministic reliability development paradigm
  • Common understanding of HALT approach is critical for success
  • The fundamentals of HALT
  • Highly accelerated stress screening (HALT) and audits (HASA)
  • HALT benefits for software/firmware performance and reliability
  • Quantitative accelerated life test
  • Failure analysis and corrective action
  • Additional applications of HALT methods.

פריטים דומים