Next generation HALT and HASS : robust design of electronics and systems /
Sábháilte in:
| Príomhchruthaitheoirí: | , |
|---|---|
| Formáid: | Leictreonach Ríomhleabhar |
| Teanga: | Béarla |
| Foilsithe / Cruthaithe: |
Chichester, West Sussex, United Kingdom ; Hoboken, NJ :
Wiley,
2016.
|
| Sraith: | Wiley series in quality and reliability engineering.
|
| Ábhair: | |
| Rochtain ar líne: | An electronic book accessible through the World Wide Web; click to view |
| Clibeanna: |
Cuir clib leis
Níl clibeanna ann, Bí ar an gcéad duine le clib a chur leis an taifead seo!
|
Clár na nÁbhar:
- Basis and limitations of typical current reliability methods & metrics
- The need for reliability assurance metrics to change
- Challenges to advancing electronics reliability engineering
- A new deterministic reliability development paradigm
- Common understanding of HALT approach is critical for success
- The fundamentals of HALT
- Highly accelerated stress screening (HALT) and audits (HASA)
- HALT benefits for software/firmware performance and reliability
- Quantitative accelerated life test
- Failure analysis and corrective action
- Additional applications of HALT methods.