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Next generation HALT and HASS : robust design of electronics and systems /

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Bibliographic Details
Main Authors: Gray, Kirk (Author), Paschkewitz, John James (Author)
Format: Electronic eBook
Language:English
Published: Chichester, West Sussex, United Kingdom ; Hoboken, NJ : Wiley, 2016.
Series:Wiley series in quality and reliability engineering.
Subjects:
Accelerated life testing.
Electronic systems > Design and construction.
Electronic systems > Testing.
Electronic books.
Online Access:An electronic book accessible through the World Wide Web; click to view
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Table of Contents:
  • Basis and limitations of typical current reliability methods & metrics
  • The need for reliability assurance metrics to change
  • Challenges to advancing electronics reliability engineering
  • A new deterministic reliability development paradigm
  • Common understanding of HALT approach is critical for success
  • The fundamentals of HALT
  • Highly accelerated stress screening (HALT) and audits (HASA)
  • HALT benefits for software/firmware performance and reliability
  • Quantitative accelerated life test
  • Failure analysis and corrective action
  • Additional applications of HALT methods.

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