Next generation HALT and HASS : robust design of electronics and systems /
Wedi'i Gadw mewn:
| Prif Awduron: | , |
|---|---|
| Fformat: | Electronig eLyfr |
| Iaith: | Saesneg |
| Cyhoeddwyd: |
Chichester, West Sussex, United Kingdom ; Hoboken, NJ :
Wiley,
2016.
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| Cyfres: | Wiley series in quality and reliability engineering.
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| Pynciau: | |
| Mynediad Ar-lein: | An electronic book accessible through the World Wide Web; click to view |
| Tagiau: |
Ychwanegu Tag
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Tabl Cynhwysion:
- Basis and limitations of typical current reliability methods & metrics
- The need for reliability assurance metrics to change
- Challenges to advancing electronics reliability engineering
- A new deterministic reliability development paradigm
- Common understanding of HALT approach is critical for success
- The fundamentals of HALT
- Highly accelerated stress screening (HALT) and audits (HASA)
- HALT benefits for software/firmware performance and reliability
- Quantitative accelerated life test
- Failure analysis and corrective action
- Additional applications of HALT methods.