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Next generation HALT and HASS : robust design of electronics and systems /

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Бібліографічні деталі
Автори:	Gray, Kirk (Автор), Paschkewitz, John James (Автор)
Формат:	Електронний ресурс eКнига
Мова:	Англійська
Опубліковано:	Chichester, West Sussex, United Kingdom ; Hoboken, NJ : Wiley, 2016.
Серія:	Wiley series in quality and reliability engineering.
Предмети:	Accelerated life testing. Electronic systems > Design and construction. Electronic systems > Testing. Electronic books.
Онлайн доступ:	An electronic book accessible through the World Wide Web; click to view
Теги:	Додати тег Немає тегів, Будьте першим, хто поставить тег для цього запису!

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