Next generation HALT and HASS : robust design of electronics and systems /
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Главные авторы: | Gray, Kirk (Автор), Paschkewitz, John James (Автор) |
---|---|
Формат: | Электронный ресурс eКнига |
Язык: | английский |
Опубликовано: |
Chichester, West Sussex, United Kingdom ; Hoboken, NJ :
Wiley,
2016.
|
Серии: | Wiley series in quality and reliability engineering.
|
Предметы: | |
Online-ссылка: | An electronic book accessible through the World Wide Web; click to view |
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