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Next generation HALT and HASS : robust design of electronics and systems /

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Detalhes bibliográficos
Principais autores:	Gray, Kirk (Autor), Paschkewitz, John James (Autor)
Formato:	Recurso Eletrônico livro eletrônico
Idioma:	inglês
Publicado em:	Chichester, West Sussex, United Kingdom ; Hoboken, NJ : Wiley, 2016.
coleção:	Wiley series in quality and reliability engineering.
Assuntos:	Accelerated life testing. Electronic systems > Design and construction. Electronic systems > Testing. Electronic books.
Acesso em linha:	An electronic book accessible through the World Wide Web; click to view
Tags:	Adicionar Tag Sem tags, seja o primeiro a adicionar uma tag!

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