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Next generation HALT and HASS : robust design of electronics and systems /

I tiakina i:

Ngā taipitopito rārangi puna kōrero
Ngā kaituhi matua:	Gray, Kirk (Author), Paschkewitz, John James (Author)
Hōputu:	Tāhiko īPukapuka
Reo:	Ingarihi
I whakaputaina:	Chichester, West Sussex, United Kingdom ; Hoboken, NJ : Wiley, 2016.
Rangatū:	Wiley series in quality and reliability engineering.
Ngā marau:	Accelerated life testing. Electronic systems > Design and construction. Electronic systems > Testing. Electronic books.
Urunga tuihono:	An electronic book accessible through the World Wide Web; click to view
Ngā Tūtohu:	Tāpirihia he Tūtohu Kāore He Tūtohu, Me noho koe te mea tuatahi ki te tūtohu i tēnei pūkete!

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