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Next generation HALT and HASS : robust design of electronics and systems /

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Dettagli Bibliografici
Autori principali:	Gray, Kirk (Autore), Paschkewitz, John James (Autore)
Natura:	Elettronico eBook
Lingua:	inglese
Pubblicazione:	Chichester, West Sussex, United Kingdom ; Hoboken, NJ : Wiley, 2016.
Serie:	Wiley series in quality and reliability engineering.
Soggetti:	Accelerated life testing. Electronic systems > Design and construction. Electronic systems > Testing. Electronic books.
Accesso online:	An electronic book accessible through the World Wide Web; click to view
Tags:	Aggiungi Tag Nessun Tag, puoi essere il primo ad aggiungerne!!

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